Test and Measurement

Combined test solution aids PCIe 5.0 standard compliance

Anritsu and Tektronix have teamed up to provide an automated PCI Express 5.0 (PCIe Gen5) test solution combining the former’s Signal Quality Analyzer-R MP1900A BERT series with the latter’s DPO70000SX 70GHz real-time Oscilloscope and automation software.

Attenuation measurement set designed for flexibility

The new attenuation measurement sets from Laser Components contain an optical transmitter (OTM) and a power meter, with which systems engineers and laboratory personnel can evaluate all wavelengths and configurations of hard-clad and plastic optical fibres.

Single-unit semiconductor analysis available

Hamamatsu Photonics has developed a semiconductor failure analysis system called the PHEMOS-X C15765-01 that in just a single unit uses visible to near-infrared light to analyse semiconductor defects.

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